Comparison of coherence scanning interferometry, focus variation and confocal microscopy for surface topography measurement
Interferometry,Metrology,Optical,Precision
Measurement platform with a multi-functional MEMS-SPM head for high-throughput characterisation of nanostructured materials
Dimensional,Nano indentation,Scanning probe microscope (SPM),Speed
The investigation of the combination of the object orientation to evaluate the measurement uncertainty of the X-ray CT using the analysis of variance
Coordinate measuring machine (CMM),Dimensional,Uncertainty,X-ray
An intelligent surface segmenter based on U-Net for structured and freeform surface
Artificial intelligence,Image,Metrology,Surface
Rapid step height measurements by polarized dual low coherence scanning interferometry
Inspection,Interferometry,Measurement,Optical
Design and manufacturing of transfer artefacts of monocrystalline silicon
Manufacturing,Silicon,Soldering,Transfer
End to end additive manufacturing for a structural aerospace component
Coordinate measuring machine (CMM),3D printing,Inspection,X-ray
Spectral assessment of surface topography
Optical,Roughness,Topography