Uploaded: 16th June 2023
AuthorChristian Kuhlmann, Zhi Li, Ole Willke, Radovan Popadic, Uwe BrandDimensional,Nano indentation,Scanning probe microscope (SPM),Speed
Download FileMeasurement platform with a multi-functional MEMS-SPM head for high-throughput characterisation of nanostructured materials
Home|Measurement platform with a multi-functional MEMS-SPM head for high-throughput characterisation of nanostructured materials