Estimation of optimal sample orientation for accurate industrial computed tomography scanning
Defect,Measurement,Uncertainty,X-ray
Defect,Measurement,Uncertainty,X-ray
Manufacturing,Metrology,Uncertainty
Metrology,Selective laser melting (SLM)
Calibration,Simulation,Uncertainty
Dimensional,Gear,Metrology,Uncertainty
Atomic force microscopy (AFM),Coordinate measuring machine (CMM),Radius
Accuracy,Deformation,Force,Uncertainty
Geometry,In-process measurement,Temperature
Calibration,Error,Measurement,Robot
Measuring instrument,Metrology,X-ray