Multi-probe roundness measurement and harmonic content of Reuleaux polygons
Geometry,Metrology,Profile,Uncertainty
Near-field spectroscopic measurement of thermally excited evanescent waves
Measurement,Microscope,Optical,Scanning probe microscope (SPM)
A novel approach for geometrical deviations determination of lattice structures from volumetric data
Defect,Geometric modelling
High-accuracy projector calibration method by reducing perspective transformation error
Calibration,Measurement,Optical
Surface figure measurements using geometric phase shearing interferometer
Measurement,Measuring instrument,Metrology,Optical
3D optical sensor in continuous motion
In-process measurement,Metrology,Microscope,Surface