High-speed interferometric thickness measurement of transparent plate and film using a current modulation technique euspen2018-04-04T14:03:24+00:00 Read More
A phase-encoding method for absolute position measurement using a single track binary code scale euspen2018-04-04T14:03:24+00:00 Read More
6 DOF repeatability measurement setup for measuring position of assembled silicon parts with nanometric resolution. euspen2018-04-04T14:03:24+00:00 Read More
Coherent structured illumination microscopy using hexagonal-lattice illumination fields for enhancing the isotropy of 2D super-resolution euspen2018-04-04T14:03:25+00:00 Read More
In-situ characterisation of nanomechanical measurement instruments using a force transfer standard with interferometric readout euspen2018-04-04T14:03:25+00:00 Read More
Characterization of nano-textured samples in a production environment euspen2018-04-04T14:03:26+00:00 Read More
Evaluation of a high-speed air turbine microspindle for monitoring machining processes using audible sound and pressure measurements euspen2018-04-04T14:03:26+00:00 Read More
The influence of tilt on surface roughness measurement using the focus variation microscope euspen2018-04-04T14:03:26+00:00 Read More
