Uploaded: 6th January 2015
AuthorFlorent CosandierAuthor, François BarrotAuthor, Johan KruisAuthor, Pascal GentschAuthor, Pius TheilerAuthor, Simon Henein Download File6 DOF repeatability measurement setup for measuring position of assembled silicon parts with nanometric resolution.
Home|6 DOF repeatability measurement setup for measuring position of assembled silicon parts with nanometric resolution.