Nano & Micro Metrology

|Nano & Micro Metrology

Characterization of large area nanostructured surfaces using AFM measurements

Force constant determination of AFM cantilevers with calibrated thermal tune method

Preliminary results of a proficiency testing of industrial CT scanners using small polymer items

An automatic interferometer capable to measure the gauge blocks up to 1,000 mm

Modeling and Simulation of 2-Dimensional Encoder System

Development of direct pain evaluation test by using Substance P

In-situ characterisation of the probing force of contact stylus profilers using a micromachined nanoforce actuator

Phase-shifting algorithms for the interferometric measurement of form error, diameter variation and refractive index inhomogeneity of fused silica spheres

Evaluation of periodic nonlinearities of optical interferometers by comparing two interferometers with different wavelength

A plateau-valley separation method for multifunctional surfaces characterization

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