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Nano & Micro Metrology
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Nano & Micro Metrology
Long Term Stability of Suprasil Line Scales and Gauge Blocks
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euspen
2018-04-04T14:01:44+00:00
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Design of a Sample Holder for a Metrological Atomic Force Microscope
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euspen
2018-04-04T14:01:42+00:00
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Temperature Stabilization of an In-process Measurement System Based on Laser Triangulation and Applied at a Furnace
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euspen
2018-04-04T14:01:43+00:00
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Development of a Micro-SPM Head Array with Exchangeable Cantilevers
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euspen
2018-04-04T14:01:43+00:00
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A Study of Surface Reconstruction for the Measurement of Ultra-precision Freeform Surfaces
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euspen
2018-04-04T14:01:43+00:00
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Development of Non-Contact Micro-Nano Displacement Sensor using Interferometric Phenomena
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euspen
2018-04-04T14:01:43+00:00
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Free Spectral Range Measurement of Fabry-Perot Cavity Using Transmission Light, Single Frequency Modulation and Null Method Under Off-resonance Condition
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euspen
2018-04-04T14:01:46+00:00
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Precise Measurement of Air-refractive-index Using Fabry-Perot Cavity and Tunable Laser Diode
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euspen
2018-04-04T14:01:47+00:00
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Three-dimensional nano-positioning system for compact CMM
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euspen
2018-04-04T14:01:47+00:00
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Investigation of Opto-Mechanical Scanning Systems with the use of a Ray-Tracing Tool
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euspen
2018-04-04T14:01:47+00:00
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