Improving of 3-D Structure Estimation Methods by Image Using Ambient Light
Estimating,Image,Improvement,Structure
Practical study on performance assessment for freeform measurement using CMMs
Calibration,Measurement,Metrology,Uncertainty
CT-based traceable interface area detection in Al7075-T6 adhesive bonded structures
Accuracy,Measurement,Uncertainty,X-ray
Efficient close-range photogrammetry reconstruction through autonomous image background removal
Metrology,Optical,Reconstruction
Ultrastable, traceable optical frequencies for length metrology in long-range nanopositioning and nanomeasuring machines
Interferometry,Laser,Stability,Ultra-precision
Absolute longitudinal distance measurement verification of a standard polystyrene nanoparticle near a surface in water by means of multi-wavelength evanescent field
In-process measurement,Microscope,Nano technology,Optical
A plate beamsplitter based stereo phase measuring deflectometry for measuring specular structured surfaces
Measurement,Metrology,Structure
Novel fibre sensor using etalon multi-reflection and pulsed interference
Laser,Measurement,Optical,Sensor
Measuring Grating Period of Dual-Periodic Grating with Dual-Wavelength External Cavity Diode Laser
Measuring instrument,Nano technology,Photonics