Capacitance analysis of a shielded sphere-flat capacitor in a high precision electrostatic force balance
Electrode,Metrology
Traceability issues for contact probe and stylus instrument measurements
Form,Metrology,Piezo-electric,Roughness
Selection of relevant mode of thin and soft parts measurements on machines with multisensor possibility
Accuracy,Coordinate measuring machine (CMM),Metrology,Uncertainty
Combined computer-aided part inspection and fixture planning
Coordinate measuring machine (CMM),Fixture,Inspection,Planning
Calibration of a low-accuracy magnetic linear encoder
Accuracy,Dimensional,Measurement,Precision
Broadband chromatic light source and inspection system for fluorescence imaging
Image,Inspection,Microscope,Optical
Towards miniaturised instrumentation realised via metasurfaces
Measuring instrument,Metrology,Miniaturization,Optical
Estimation of optimal sample orientation for accurate industrial computed tomography scanning
Defect,Measurement,Uncertainty,X-ray
Uncertainty propagation of the field areal surface texture parameters using the metrological characteristics approach
Manufacturing,Metrology,Uncertainty