Uploaded: 21st September 2023
AuthorXiao Chen, Shan Lou, Wenhan Zeng, Xiangqian Jiang, Paul Scott, Wenjuan SunMetrology,Resolution,Surface,X-ray
Download FileInvestigation of focal spot blurring and its deblurring to improve the metrological structural resolution of XCT in the surface metrology of additively manufactured parts
Home|Investigation of focal spot blurring and its deblurring to improve the metrological structural resolution of XCT in the surface metrology of additively manufactured parts