In-situ transient current detection in local anodic oxidation nanolithography using conductive diamond-coated probes
Atomic force microscopy (AFM);Monitoring;Nano manufacturing;Oxidation
Atomic force microscopy (AFM);Monitoring;Nano manufacturing;Oxidation
Deposition;Electrical discharge machining (EDM);Microstructure;Welding
Acoustic;Artificial intelligence;Monitoring;Surface
Actuator;Friction;Mechatronic;Piezo-electric
Manufacturing (CAM);Ecology;Numerical control (NC);Simulation
Control;Performance;Positioning;Ultra-precision
Compensation;In-process measurement;Micromachining;Optical
Actuator;Cutting;Finishing;Grinding