Uploaded: 14th June 2024
AuthorJian GaoAuthor, Wenkun XieAuthor, Xichun LuoAtomic force microscopy (AFM);Monitoring;Nano manufacturing;Oxidation
Download FileIn-situ transient current detection in local anodic oxidation nanolithography using conductive diamond-coated probes
Home|In-situ transient current detection in local anodic oxidation nanolithography using conductive diamond-coated probes