Enhanced In-Situ Focus Variation Surface Metrology via Pattern-Projected Illumination for Highly Polished Additive Manufacturing Surfaces
Manufacturing (CAM);Measuring instrument;Metrology;Optical
Manufacturing (CAM);Measuring instrument;Metrology;Optical
Artificial intelligence;In-process measurement;Optimisation;Visual inspection
Measuring instrument;Metrology;Optical;Topography
Engineering;Micromachining;Surface;Ultra-precision