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The University of Tokyo
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The University of Tokyo
Nanometer Profile Measurement of Large Aspheric Optical Surface by Scanning Deflectometry with Rotation Devices – Development of Three Dimensional Measuring Facility and Experiment
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2018-04-04T14:05:13+00:00
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Nanometer Profile Measurement of Large Aspheric Optical Surface by Scanning Deflectometry with Rotatable Devices: Error Analysis and Experiments
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2018-04-04T14:06:35+00:00
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Metal-polymer direct joining: effect of polymer injection speed on joint strength
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2018-04-04T14:07:10+00:00
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Development of 3D form measurement of semiconductor structure ~ Measurement of FinFET profile using TEM and CD-SEM images ~
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2018-04-04T14:07:42+00:00
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Precision measurement technique for rough surface object using self-beat signals of optical frequency comb
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2017-08-21T00:00:00+00:00
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