International Scientific Committee 2022
Representing Organisations
59
Spain
Dr J. A. Albajez
University of Zaragoza
Sweden
Prof. A. Archenti
KTH
Germany
Dr F. Balzer
Hexagon Metrology GmbH
UK
Dr A. Bennett
Cranfield Plasma Solutions
Spain
Dr C. Bermudez
Sensofar
France
Dr F. Blateyron
Digital Surf
Switzerland
N. Blondiaux
CSEM SA
USA
Dr E. Buice
Lawrence Berkeley National Laboratory
Germany
Dr B. Bulla
son-x GmbH
Denmark
M. Calaon
Technical University of Denmark
Denmark
Dr K. Carneiro
Technical University of Denmark
UK
Dr S. Catalucci
The University of Nottingham
UK
Prof. K. Cheng
Brunel University
Hong Kong
Prof. B. Cheung
The Hong Kong Polytechnic University
Switzerland
Dr F. Cosandier
CSEM
Brazil
Dr C. de Assis
Federal Institute of Sao Paulo
USA
Dr P. de Groot
Zygo Corporation
Belgium
Dr A. Demarbaix
HEPH Condorcet
Belgium
Prof. F. Ducobu
UMONS
Germany
Dr J. Edelmann
Fraunhofer IWU
China
Assist. Prof. X. Feng
Shanghai Jiao Tong University
Italy
Prof. M. Galetto
Politecnico di Torino
Polan
Prof. A. Gąska
Cracow University of Technology
Brazil
Assoc. Prof. R. Goulart Jasinevicius
University of São Paulo
USA
Dr R. Grejda
Corning Tropel
China
Prof. J. Guo
Dalian University of Technology
Belgium
Dr H. Haitjema
KU Leuven
Denmark
Prof. H. N. Hansen
Technical University of Denmark
Czech Republic
Dr O. Horejš
Czech Technical University in Prague
Denmark
Assoc. Prof. A. Islam
Technical University of Denmark
Czech Republic
Dr M. Janota
Czech Technical University in Prague
South Korea
Prof. K. Joo
Chosun University
Croatia
Assist. Prof. E. Kamenar
University of Rijeka
Germany
Dr B. Karpuschewski
University of Bremen (LFM)
Germany
Jun.-Prof. T. Kissinger
University of Ilmenau
Switzerland
Dr W. Knapp
Engineering Office
Germany
Dr S. Kühne
Technical University Berlin
Germany
Dr. Y. B. P. Kwan
Carl Zeiss SMT GmbH
UK
Prof. R. Leach
The University of Nottingham
Singapore
Y. J. Lee
National University of Singapore
China
Y. Li
Fine Optical Engineering Research Center
Switzerland
Dr T. Liebrich
Rhysearch
United Kingdom
Dr S. Lou
University of Huddersfield
UK
Prof. X. Luo
University of Strathclyde
Switzerland
Dr H. Mainand Durand
CERN
Czech Republic
Dr M Mareš
Czech Technical University in Prague
USA
Prof. E. Marsh
Penn State University
Switzerland
Dr J. Mayr
IWF, ETH Zurich
Japan
Prof. W. Natsu
Tokyo University of Agriculture and Technology
Singapore
Dr D. W. K. Neo
Singapore Institute of Manufacturing Technology (SIMTech)
France
Dr H. Nouira
Laboratoire National de Métrologie et d’Essais (LNE)
Germany
Prof. D. Oberschmidt
TU Berlin
Germany
Dr G. Olea
Huber Diffraction GmbH
Sweden
Assist. Prof. T. Österlind
KTH Royal Institute of Technology
Croatia
Dr M. Percic
University of Rijeka
Italy
Assoc. Prof. G. Percoco
Polytechnic University of Bari
Belgium
Dr J. Qian
KU Leuven
Germany
Dr O. Riemer
University of Bremen (LFM)
Italy
Prof. E. Savio
University of Padua
Germany
Dr H. Scheibe
Carl Zeiss Jena GmbH
Poland
Assist. Prof. S. Skoczypiec
Cracow University of Technology
UK
Dr J. Stammers
Advanced Manufacturing Research Centre
Japan
Dr K. Takamasu
University of Tokyo
Japan
Dr Y. Takeuchi
Chubu University
USA
Dr J.S. Taylor
University of North Carolina at Charlotte
Germany
Dr H. Thiess
Carl Zeiss SMT GmbH
UK
L. Todhunter
The University of Nottingham
Sweden
Dr R. Tomkowski
KTH Royal Institute of Technology
UK
Dr Z. Tong
EPSRC Future Metrology Hub, University of Huddersfield
Denmark
Assoc. Prof. G. Tosello
Technical University of Denmark
Czech Republic
P. Vavruska
Czech University
Finland
Asst. Prof. R. Viitala
Aalto University School of Engineering
Hong Kong
Dr C. Wang
The Hong Kong Polytechnic University
Spain
Prof. José Yagüe-Fabra
University of Zaragoza
UK
Dr N. Yu
University of Edinburgh
Italy
Dr F. Zanini
University of Padua
Croatia
Prof. S. Zelenika
University of Rijeka
Singapore
J. Zhang
National University of Singapore
