A Metrologic approach for camera calibration using traceable artefact
Accuracy,Algorithm,Calibration,Dimensional
Small footprint high-speed optical 3D profiler
Interferometry,Metrology,Microscope,Surface
Study of the influence of filter material on the roughness evaluation by means of CT
Accuracy,Calibration,Dimensional
A sensitivity analysis of the rotation stage misalignments effect on X-ray computed tomography dimensional measurements
Dimensional,Geometry,Metrology,X-ray
Interferometric calibration of a high-accuracy piezo actuator at FSB-LPMD
Dimensional,Interferometry,Metrology
Flatness measurement by scanning deflectometric profiler
Accuracy,Flatness,Profile,Topography
Absolute optical length measurement of etalon using pulsed interferometer
Accuracy,Laser,Measurement,Optical
A new sub-nanometre error separation technique
Accuracy,Measuring instrument,Spindle,Ultra-precision
In-situ measurement of electrochemical jet machining using low coherence interferometry
Electro chemical machining (ECM),In-process measurement,Interferometry,Metrology