Metrology is Prominent at Europe’s Number One Precision Engineering Event

Micro and nano-accurate metrology solutions are key among the topics being covered at the 19th Annual Conference and Exhibition hosted by the European Society for Precision Engineering and Nanotechnology (euspen) this year running 3 – 7 June in Bilbao, Spain. Players in the precision metrology space have elevated the status of metrology to a disruptive,

NPL’s 3rd Dimensional X-ray Computed Tomography Conference

(2 - 3 July 2018, Jubilee Conference Centre, University of Nottingham, Nottingham, UK) The National Physical Laboratory’s Dimensional X-ray Computed Tomography (dXCT) conference is an annual conference presenting and disseminating the latest developments in XCT for dimensional measurement and its industrial impact across a variety of applications. The conference is also expected to define synergies and opportunities

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