Progress in nanometrology: reduction of measurement uncertainty of step height and etching depth calibration down to 0.3 nm
Accuracy,Atomic force microscopy (AFM),Metrology,Nano technology
Accuracy,Atomic force microscopy (AFM),Metrology,Nano technology
Dressing,Grinding,Micromachining,Tool
Accuracy,Calibration,Measurement,Uncertainty
Mechanical,Nano manufacturing,Polymer,Tensile
Finite element method (FEM),Micromachining,Spindle,Vibration
Compensation,Optical,Robot,Roughness
Dynamic,Evaluation,Machine,Modelling
Kinematic,Parallel,Precision
Accuracy,Calcium fluoride,Coating,Micromachining,Ultra-precision