Enhanced In-Situ Focus Variation Surface Metrology via Pattern-Projected Illumination for Highly Polished Additive Manufacturing Surfaces
Manufacturing (CAM);Measuring instrument;Metrology;Optical
Manufacturing (CAM);Measuring instrument;Metrology;Optical
Alignment;Emission;Error;Positioning
Artificial intelligence;In-process measurement;Optimisation;Visual inspection
Laser micro machining;Optical;Silicon;Surface
Accuracy;3D printing;Feedback;Monitoring