A New Vision-Based System with Nanometer Resolution over Millimetric Ranges for Measuring the 6-DoF of Positioning Stages
Holography;Measuring instrument;Robot
Holography;Measuring instrument;Robot
Bearing;Finite element method (FEM);Modelling;Precision;Spindle
Nano technology;Positioning
Actuator;Diagnostics;Model;Monitoring
Design method;Dynamic;Optimisation;Ultra-precision
Estimating;Identification;Mechatronic;Modelling
Actuator;Control;Modelling;Piezo-electric
Control;Mechatronic;Piezo-electric;Vibration