Nanometer Profile Measurement of Large Aspheric Optical Surface by Scanning Deflectometry with Rotation Devices – Development of Three Dimensional Measuring Facility and Experiment euspen2018-04-04T14:05:13+00:00 Read More
Nanometer Profile Measurement of Large Aspheric Optical Surface by Scanning Deflectometry with Rotatable Devices: Error Analysis and Experiments euspen2018-04-04T14:06:35+00:00 Read More
Metal-polymer direct joining: effect of polymer injection speed on joint strength euspen2018-04-04T14:07:10+00:00 Read More
Development of 3D form measurement of semiconductor structure ~ Measurement of FinFET profile using TEM and CD-SEM images ~ euspen2018-04-04T14:07:42+00:00 Read More
Precision measurement technique for rough surface object using self-beat signals of optical frequency comb euspen2017-08-21T00:00:00+00:00 Read More
