PTB

Mechanical Properties Characterization of Nanowire Arrays for Piezoelectric Energy Harvesting

Atomic force microscopy (AFM);Material;Nano technology

Microprobes for high-speed roughness measurements

Probe,Roughness

Thermal Design and Dimensional Drift

Demands for nanoradian angle metrology and performance requirements on autocollimators

Concept of metrological reference surfaces for asphere and freeform metrology

In-situ characterisation of nanomechanical measurement instruments using a force transfer standard with interferometric readout

Calibration of circular apertures using an optical CMM

The EMRP Project “Thermal design and dimensional drift”

Topographical profiler investigations on a sphere

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