Physikalisch-Technische Bundesanstalt

|Physikalisch-Technische Bundesanstalt

Quantitative assessment of nano wear of DLC coated samples using AFM and optical confocal microscopy

Measurement and Evaluation Processes for Inner Micro Structures

Traceable profilometer with a piezoresistive cantilever for high-aspect-ratio microstructure metrology

Thermal expansion and long term stability of ceramics NEXCERA studied by absolute length measurements using multiple wavelengths imaging interferometry

Flatness Measurements with the Deflectometric Flatness Reference at PTB

Traceable characterisation of high-precision moving stages with displacement resolutions down to 10 pm

Reference areal surface metrology by high speed metrological large range AFM

Implementation of a metrological UHV-STM

Straightness measurements with sub-nanometre repeatability

A fully-fibre coupled interferometer system for displacement and angle metrology

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