Benchmarking of Geometric Accuracy in PBF-LB/M: Approach to expand VDI 3405 for AlSi10Mg
Accuracy;Computer aided design (CAD);Dimensional;X-ray
Novel hybrid interference and atomic force microscopy for in-situ reference areal surface metrology
Atomic force microscopy (AFM);Interferometry;Metrology;Topography
Novel nanopositioning system with improved range, dynamics and accuracy
Accuracy;Dynamic;Piezo-electric;Positioning
Novel hybrid AI-PID controller
Artificial intelligence;Atomic force microscopy (AFM);Control;Reliability
Influence of the inhomogeneity of the field of view on the measurement of surface texture in optical surface topography measuring instruments
Metrology;Microscope;Surface;Uncertainty
Nanomechanical and -electrical characterisation of vertical nanowires for energy harvesting at the nanoscale
Calibration;Measuring instrument;Metrology;Nano indentation
Manufacturing of lamella of monolithic single-crystal silicon X-ray and neutron interferometers
Grinding;Silicon;Single crystal;Surface
Calibration of reference spheres by double-ended- interferometry
Calibration;Interferometry;Metrology
Laser cutting and structuring for processing aluminium nitride chips for optical clocks
Development;Laser beam machining (LBM);Manufacturing;Processing