INRIM

Beam separated coaxial interferometer with picometer non-linearity for accurate measurements at the nanoscale

Interferometry,Metrology

Characterization of 2D angular actuators to the nanoradian level

Accuracy,Measuring instrument,Metrology,Precision

3D characterization of printed structures by stylus- and optical-based measurements

Metrology,Optical,Profile,Topography

Dynamics modeling of CMM probing systems

Surface Texture Measurements of Gear Tooth

1D measurement of coordinates in space: a novel apparatus

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