Atomic force microscopy (AFM),Measurement,Nano manufacturing,Nano technology
Tapping AFM measurements artefacts in the acquisition of high-aspect-ratio rectangular nano structures using dedicated sharp tips
About the Author: David Billington
Tapping AFM measurements artefacts in the acquisition of high-aspect-ratio rectangular nano structures using dedicated sharp tips
Home|Tapping AFM measurements artefacts in the acquisition of high-aspect-ratio rectangular nano structures using dedicated sharp tips
Leave A Comment