Metrology and Properties of Surfaces incorporating Structured & Freeform Surfaces
London Southbank University, London
14th – 16th July 2026
We are delighted to announce the Metrology & Properties of Surfaces event (incorporating a Special Interest Conference on Structured and Freeform Surfaces) will take place at London Southbank University (LSBU) in London, UK on Tuesday 14th to Thursday 16th July 2026. The event will be held inside the Learning Lounge at LSBU.
Metrology & Properties of Surfaces, a long standing international conference focusses on the metrology of surfaces instrumentation, characterisation and surface properties in engineering, tribological archaeological and medical applications. All oral papers will be published in the Institute of Physics Journal; Surface Topography : Metrology and Properties https://iopscience.iop.org/journal/2051-672X
Structured and Freeform Surfaces play an increasingly important role in many technology advancements ranging from optics to biomedical and energy applications. The functional characteristics of such surfaces supersede those of “traditional” surfaces, thus opening research and development avenues and new challenges for their specification, fabrication, measurement and verification.
The next euspen Special Interest Conference (SIC) on Structured and Freeform Surfaces combined with Metrology & Properties of Surfaces will bring together researchers and practitioners from academia, industry and government agencies to discuss state-of-the-art practice, and key research and development in the area of precision engineering associated with structured and freeform surfaces. The conference includes keynote presentations, oral sessions, posters covering the newest developments and research on metrology on surfaces instrumentation, characterisation and surface properties across aerospace, bio-medical and tribological archaeological applications.
The organising committee and local hosts for this combined event on Metrology & Properties of Surfaces and euspen‘s Special Interest Conference on Structured Freeform Surfaces are:-
Prof. Liam Blunt, University of Huddersfield, UK; Prof. Bengt Goran Rosen, Halmstad University, SE, Prof. Saurav Goel, London Southbank University (LSBU), UK; Dr. Mohammed El Mansori, France, Hassan Zahouani, France
Combined Topics
Combined Conference Topics:
- Design, Traceability and Calibration
- Functional Surfaces; Bio Engineering; Data Storage; Aesthetic Surfaces; Archaeology and Anthropology; Forensic Applications
- Large Scale Surface Structuring and Structure Characterisation
- Measurement & Instrumentation including XCT and In-Process Measurement
- Surface and Freeform Characterisation
- Surface Generation by Manufacturing Processes
- Surface Simulation, Data-Drive Modelling and Artificial Intelligence
- Tribology and Wear
Key Dates
6th April 2026 – Call for papers deadline for Oral and Poster Presentation
8th May 2026 – Notification of presentation award (oral/poster)
11th May 2026 – Registration opens
15th May 2026 – Final submission of reviewed papers
Registration Fees
* Student members fee is not inclusive of the networking dinner.
All speakers and presenters must register for the conference using the appropriate delegate fee.
Registration
Euspen events comply with international VAT/IVA/VAT MOSS rules. As such the relevant Standard VAT dependent upon the Country hosting the event.
Met & Props and euspen SIC meeting on Structured & Freeform Surfaces takes place in England, UK and as such the relevant Standard UK VAT of 20% will be applied to all delegate registration invoices.
Select Credit Card if you would like to pay by credit card :-
Select Invoice if you would like to pay by invoice :-
- A valid Purchase Order (PO) number is required to guarantee payment.
- An administration fee of £30 will be applied.
- All invoices must be settled prior to attendance of the event. If the invoice remains outstanding at the point of attendance, the delegate will be required to pay the invoice via credit card before admittance.
- Your completed form should be sent to info@euspen.eu and an invoice will be sent to you manually.
Submit an abstract for
Metrology & Properties of Surfaces incorporating SIC on Structured & Freeform Surfaces
We are delighted to bring together leading expertise globally to an open forum for
focused presentations and discussions combining Metrology & Properties of Surfaces & Structured and Freeform Surfaces
Announcement & Call for Papers
Come and join your international peers and maintain a leading edge on technology, customers, partners and suppliers. Access the greatest minds in the long-standing international conferences of Metrology & Properties of Surfaces and Structured & Freeform Surfaces. Share knowledge and information and stimulate debates.
Combined Conference Topics:
- Design, Traceability and Calibration
- Functional Surfaces; Bio Engineering; Data Storage; Aesthetic Surfaces; Archaeology and Anthropology; Forensic Applications
- Large Scale Surface Structuring and Structure Characterisation
- Measurement & Instrumentation including XCT and In-Process Measurement
- Surface and Freeform Characterisation
- Surface Generation by Manufacturing Processes
- Surface Simulation, Data-Drive Modelling and Artificial Intelligence
- Tribology and Wear
Keynotes & SOTA
Surface Metrology: From Optics to Nanophotonics
Professor Dame Xiangqian (Jane) Jiang DBE FREng, University of Huddersfield, UK
In this talk, I would like to show a new way to construct surface measurement sensor/ instrumentation by building on the foundations of nanophotonics. We exploit the exceptional control of electromagnetic fields provided by metasurfaces, focusing on the creative metrology-capability of nanophotonic metasurfaces that allow precise manipulation of the phase, polarisation and amplitude of light, but without the bulk optics required when using traditional approaches.
By using metasurfaces ultra-compact sensors can be created, however the advantage that these structures offer goes far beyond this. In some cases, a single metasurface can be used to deliver the functionality previously delivered by several traditional optical elements.
This talk will report on recent developments of metasurfaces for surface metrology applications and outline how nanophotonics have the potential to revolutionise optical sensor technology by supporting sensor integration through miniaturisation and enhanced functionality.
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Atomic-scale Precision in Optical Scattering Metrology
Prof. Kevin MacDonald, University of Southampton, UK
Kevin MacDonald is a Professor of Photonics at the University of Southampton’s Optoelectronics Research Centre (ORC). He received MPhys and PhD degrees from Southampton’s School of Physics and Astronomy before joining as a researcher in 2001, and moving to the ORC in 2006. He is one of the leaders, indeed a founding member, of the nanophotonics and metamaterials research field in the UK. He has been a member of the leadership team for a number of UK flagship EPSRC Programme and Hub research on the physics and technology of photonic metamaterials and metadevices – pioneering topics including phase-change and electron-beam nanophotonics, active plasmonics, opto-mechanical metamaterials, and lately metamaterial ‘time crystals’ and nanophotonic metrology.
Prof MacDonald has served on the Institute of Physics’ Quantum Electronics and Photonics Group steering committee; has represented the UK on the Laser Physics and Photonics Commission of the International Union of Pure and Applied Physics (IUPAP); and since 2014 has co-chaired the SPIE Photonics Europe Metamaterials conference. He was elected an Optica Fellow in 2023.
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Tactile perception of topography and the identification of spatial resolution
Dr. Hassan Zahouani, EC Lyon, France
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