A novel approach for geometrical deviations determination of lattice structures from volumetric data
Defect,Geometric modelling
Defect,Geometric modelling
Metrology,Monitoring,Resolution,X-ray
Calibration,Measurement,Optical
Measurement,Measuring instrument,Metrology,Optical
In-process measurement,Metrology,Microscope,Surface
Estimating,Image,Improvement,Structure
Calibration,Measurement,Metrology,Uncertainty