Pitch measurements validation of a structural coloured steel insert using Scanning Confocal Microscopy (SCM) and Atomic Force Microscopy (AFM)
Atomic force microscopy (AFM),Cutting,Metrology,Texture
Optimisation of the number of projections in industrial X-ray computed tomography for dimensional measurements on multimaterial workpieces
Coordinate measuring machine (CMM),Metrology,Optical,Optimisation,Photonics
Image drift compensation technique for improved measurement accuracy in XCT
Accuracy,Quality assurance,X-ray
Performance evaluation of a CMM tactile scanning probing system according to the revised ISO 10360 standard
Coordinate measuring machine (CMM),Dimensional,Performance,Standardization
A novel calibration procedure for multiple large-volume-metrology instruments
Calibration,Metrology,Probe,Sensor
Form metrology of optical surfaces based on partial coherent shearing interferometry in reflection
Form,Interferometry,Metrology
Film measurement through transparent medium using Linnik type white-light spectral interferometer
Interferometry,Metrology,Microscope
Investigation of Single Shot Dual Wavelength Polarised Interferometer using Carre and Four Step Phase Shift Algorithms
Inspection,Interferometry,Metrology,Nano technology
Automated contact area measurements on structured surfaces
Analysis,Computer automated,Image,Surface
Insufficiency of the SPAM test for spindle error motion measurement
Bearing,Error,Metrology,Spindle