Quantification of defects in CFRP plates using active Lock-In thermography and artificial neural networks
Composite,Metrology,Neural network,Quality assurance
Measurement error model for laser line scanners
Coordinate measuring machine (CMM),Measurement,Metrology,Uncertainty
Conceptional design of a positioning device with subatomic resolution and reproducibility
Linear,Mechanism,Metrology,Silicon
A phase retrieval inspired approach for the determination of optical aberrations in microscopy
Analysis,Dimensional,Metrology,Microscope
In-Situ Displacement Measurement for use in LHC Collimators
Fiber,Interferometry,Measurement,Straightness
Reduction of noise bias in 2.5D surface measurements
Interferometry,Metrology,Microscope,Roughness
Modulation-based long-range interferometry as basis for an optical two-color temperature sensor
Geometry,Interferometry,Nd:YAG laser,Thermal error
METAS-CT: Metrological X-ray computed tomography at sub-micrometre precision
Coordinate measuring machine (CMM),Dimensional,Metrology,X-ray