CT-based traceable interface area detection in Al7075-T6 adhesive bonded structures
Accuracy,Measurement,Uncertainty,X-ray
Efficient close-range photogrammetry reconstruction through autonomous image background removal
Metrology,Optical,Reconstruction
Ultrastable, traceable optical frequencies for length metrology in long-range nanopositioning and nanomeasuring machines
Interferometry,Laser,Stability,Ultra-precision
Absolute longitudinal distance measurement verification of a standard polystyrene nanoparticle near a surface in water by means of multi-wavelength evanescent field
In-process measurement,Microscope,Nano technology,Optical
A plate beamsplitter based stereo phase measuring deflectometry for measuring specular structured surfaces
Measurement,Metrology,Structure
Novel fibre sensor using etalon multi-reflection and pulsed interference
Laser,Measurement,Optical,Sensor
Measuring Grating Period of Dual-Periodic Grating with Dual-Wavelength External Cavity Diode Laser
Measuring instrument,Nano technology,Photonics
Microprobes for high-speed roughness measurements
Probe,Roughness
Generation of triangle mesh softgauges and AM material measures for surface texture characterization
Roughness,Selective laser melting (SLM),Topography,X-ray