Measuring range extension of spectrally-resolved interferometry by using a polarization pixelated CMOS camera
Interferometry,Measurement,Measuring instrument,Metrology
Interferometry,Measurement,Measuring instrument,Metrology
Electrical discharge machining (EDM),Injection,Micromachining,Microstructure
Laser beam machining (LBM),Polishing,Shape memory alloy,Surface
Accuracy,Control,Cutting,Precision
Analysis,Computer aided design (CAD),Machine,Precision
Deposition,3D printing,Parameter,Welding
Die,3D printing,Extrusion,Tooling
Defect,Metrology,Performance,Surface