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Full Paper
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Full Paper
Development of a Scanning Probe Microscope for Traceable Nanoscale Length Metrology
euspen
2018-04-04T14:01:47+00:00
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Ultra-compact Non-invasive Interferometric Displacement Sensor
euspen
2018-04-04T14:01:48+00:00
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“NEXCERA”, Zero Thermal Expansion Ceramic for Ultra Precision Applications
euspen
2018-04-04T14:01:49+00:00
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Removal of Artifacts in X-ray CT by Using Extended ROI
euspen
2018-04-04T14:01:50+00:00
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Integrating Measuring Uncertainty of Tactile and Optical Coordinate Measuring Machines in the Process Capability Assessment of Micro Injection Moulding
euspen
2018-04-04T14:01:50+00:00
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Accuracy Optimization of High-speed AFM Measurements Using Design of Experiments
euspen
2018-04-04T14:01:50+00:00
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Nanoscale Displacement Sensing Using Surface Plasmonics Excited by Broadband Light
euspen
2018-04-04T14:01:51+00:00
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Micro Raman Spectroscopy as a Powerful Technique to Analyze Structural Phase Transitions of Silicon Crystals
euspen
2018-04-04T14:01:51+00:00
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Thin-film Characterization by SNOM
euspen
2018-04-04T14:01:51+00:00
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Integrated Auto Alignment and Calibration for High Resolution Capacitive Sensor System
euspen
2018-04-04T14:01:51+00:00
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