Uploaded: 6th June 2019
AuthorDario Loaldi, Danilo Quagliotti, Matteo Calaon, Ilja Czolkos, Alicia Johansson, Theodor Nielsen, Jørgen Garnæs, Guido ToselloAtomic force microscopy (AFM),Measurement,Nano manufacturing,Nano technology
Download FileTapping AFM measurements artefacts in the acquisition of high-aspect-ratio rectangular nano structures using dedicated sharp tips
Home|Tapping AFM measurements artefacts in the acquisition of high-aspect-ratio rectangular nano structures using dedicated sharp tips