Tapping AFM measurements artefacts in the acquisition of high-aspect-ratio rectangular nano structures using dedicated sharp tips

Uploaded: 6th June 2019

Author: Dario Loaldi, Danilo Quagliotti, Matteo Calaon, Ilja Czolkos, Alicia Johansson, Theodor Nielsen, Jørgen Garnæs, Guido Tosello

Atomic force microscopy (AFM),Measurement,Nano manufacturing,Nano technology

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