Uploaded: 29th November 2023
AuthorJaqueline Stauffenberg, Johannes Belkner, Jasmin Ruprecht, Ingo Ortlepp, Eberhard ManskeAtomic force microscopy (AFM),Nano manufacturing,Positioning
Download FileNanometrology and nanofabrication using a tip-based system combined with a planar nanopositioning machine (NFM-100)
Home|Nanometrology and nanofabrication using a tip-based system combined with a planar nanopositioning machine (NFM-100)