Enriching micro-scale metrology with an all-optical dimensional measuring system

Uploaded: 18th November 2017

AuthorRichard Leach,Waiel Elmadih,Samanta Piano,Nicola Senin,Danny Sims-Waterhouse,Wahyudin Permana Syam,Rong Su,Matthew Thomas

Coordinate measuring machine (CMM),Knowledge based system,Metrology,Surface

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