Uploaded: 6th June 2019
AuthorGaoliang Dai, Benedikt Seeger, Thomas Weimann, Weichang Xie, Dorothee Hüser, Rainer TutschMetrology,Microscope,Nano technology,Surface
Download FileDevelopment of a novel material measure for characterising instrument transfer function (ITF) considering angular-dependent asymmetries of areal surface topography measuring instruments
Home|Development of a novel material measure for characterising instrument transfer function (ITF) considering angular-dependent asymmetries of areal surface topography measuring instruments