Uploaded: 10th June 2021
AuthorSonja Kieren-Ehses, Tobias Mayer, Benjamin Kirsch, Jan C. AurichAtomic force microscopy (AFM),Milling,Radius,Tool
Download FileAtomic force microscope for in situ micro end mill characterization – Part I: Integration into a desktop sized machine tool
Home|Atomic force microscope for in situ micro end mill characterization – Part I: Integration into a desktop sized machine tool