Uploaded: 6th June 2019
AuthorOlusayo Obajemu, Mahdi Mahfouf, Thomas E McLeay, Xiangqian Jiang, Paul Scott, Visakan KadirkamanathanMetrology,Modelling,Profile,Uncertainty
Download FileA new Gaussian process-based approach for uncertainty propagation in surface metrology profile parameters estimation
Home|A new Gaussian process-based approach for uncertainty propagation in surface metrology profile parameters estimation