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2017
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2017
Towards metrological computed tomography at METAS
euspen
2018-04-04T13:57:50+00:00
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The synthesis and metrology of colloidal semiconductor nanocrystals
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2018-04-04T13:57:50+00:00
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A bottom-up approach for traceable nano dimensional metrology
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2018-04-04T13:57:51+00:00
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Multi-wire EDM slicing of semiconductors with group power supplying method
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2018-04-04T13:57:51+00:00
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Effects of the Cathode Dimension on the Pit Formation by Scanning Micro Electrochemical Flow Cell (SMEFC)
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2018-04-04T13:57:51+00:00
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Manufacturing of surface structures by two-stage laser ablation
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2018-04-04T13:57:51+00:00
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Modelling and validation of position dependant structural deformations of a machine tool structure under gravitational loads
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2018-04-04T13:57:52+00:00
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Non-contact transfer method of thin plate using multiphase air flow
euspen
2018-04-04T13:57:52+00:00
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Investigation of critical edge radius effect for the variation of ultra-precision machining results of difficult-to-cut materials
euspen
2018-04-04T13:57:52+00:00
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Laser confocal microscope noise estimation on injection-compression-moulded transparent polymer Fresnel lenses
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2018-04-04T13:57:53+00:00
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