Practical study on performance assessment for freeform measurement using CMMs
Calibration,Measurement,Metrology,Uncertainty
First prototype of a positioning device with subatomic resolution
Mechanism,Metrology,Microstructure,Positioning
Active vibration isolation with integrated virtual balance mass for a motion stage
Adaptive control,Motion,Ultra-precision,Vibration
Investigations on the Tracking Control and Performance of a Long Stroke Vertical Nanopositioning Drive
Control,Drive,Motion,Nano technology
CT-based traceable interface area detection in Al7075-T6 adhesive bonded structures
Accuracy,Measurement,Uncertainty,X-ray
Zirconium dioxide-reinforced aluminium oxide ceramic for micro-milling of graphite
Ceramic,Cutting,Milling
Efficient close-range photogrammetry reconstruction through autonomous image background removal
Metrology,Optical,Reconstruction
Ultrastable, traceable optical frequencies for length metrology in long-range nanopositioning and nanomeasuring machines
Interferometry,Laser,Stability,Ultra-precision
Absolute longitudinal distance measurement verification of a standard polystyrene nanoparticle near a surface in water by means of multi-wavelength evanescent field
In-process measurement,Microscope,Nano technology,Optical
Proposal of a novel peeling of nano-particle (PNP) process for localized material removal on a hard material surface by controllable magnetic fields
Microscope,Nano manufacturing,Observer,Optical