Traceability in manufacturing metrology: do we still need artefacts?
https://www.euspen.eu/wp-content/uploads/2020/06/Prof-Simone-Carmignato-v3.mp4
P5.23 : Development of a reference object for accuracy evaluation of CT measurements of additively manufactured metal lattice structures
https://www.euspen.eu/wp-content/uploads/2020/05/Presentation_ICE20370_0507042839.mp4
P5.17 : A sensitivity analysis of the rotation stage misalignments effect on X-ray computed tomography dimensional measurements
https://www.euspen.eu/wp-content/uploads/2020/05/Presentation_ICE20296_0504030819.mp4