Towards a general framework for measurement uncertainty estimation with any complex surface topography
Accuracy,Optical,Surface,Uncertainty
Accuracy,Optical,Surface,Uncertainty
Coordinate measuring machine (CMM),Knowledge based system,Metrology,Surface
Coordinate measuring machine (CMM),Knowledge based system,Metrology,Surface
In-process measurement,Reconstruction,Selective laser melting (SLM),Sensor
Form,In-process measurement,Surface,Texture