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Tianjin University
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Tianjin University
Film measurement through transparent medium using Linnik type white-light spectral interferometer
Interferometry,Metrology,Microscope
David Billington
2018-08-17T13:38:19+00:00
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Simulation of surface morphology and roughness during helical milling operation
euspen
2018-04-04T13:57:34+00:00
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Removal of nanoscale damage induced by FIB nanofabrication on single-crystal diamond using femtosecond laser treatment
euspen
2018-04-04T14:08:07+00:00
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