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Tianjin University, China
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Tianjin University, China
Phase detection type SPR (PD-SPR) sensor for Thin Films Thickness and optical constants
Interferometry,Measurement,Metal,Sensor
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David Billington
2019-06-14T13:45:14+00:00
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MEMS Surface Characterization Based on White Light Phase Shifting Interferometry
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euspen
2018-04-04T14:02:00+00:00
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