Film measurement through transparent medium using Linnik type white-light spectral interferometerInterferometry,Metrology,Microscope David Billington2018-08-17T13:38:19+00:00 Read More
Simulation of surface morphology and roughness during helical milling operation euspen2018-04-04T13:57:34+00:00 Read More
Removal of nanoscale damage induced by FIB nanofabrication on single-crystal diamond using femtosecond laser treatment euspen2018-04-04T14:08:07+00:00 Read More
