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KULeuven
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KULeuven
Reduction of noise bias in 2.5D surface measurements
Interferometry,Metrology,Microscope,Roughness
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Dishi Phillips
2020-07-23T15:59:28+00:00
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Effects of the Cathode Dimension on the Pit Formation by Scanning Micro Electrochemical Flow Cell (SMEFC)
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euspen
2018-04-04T13:57:51+00:00
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Design of a Sample Holder for a Metrological Atomic Force Microscope
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euspen
2018-04-04T14:01:42+00:00
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Multiple Discharge Phenomenon in Micro-EDM with RC Type Generator
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euspen
2018-04-04T14:03:42+00:00
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Theoretical Study on the Radial Error Motion of High-precision Aerostatic Rotary Tables
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euspen
2018-04-04T14:06:20+00:00
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Design and experimental validation of a slit-type gas journal bearing
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euspen
2018-04-04T14:06:47+00:00
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