In-line microfocus X-ray focal spot condition monitoring for computed tomography
Metrology,Monitoring,Resolution,X-ray
High-resolution X-ray computed tomography for additive manufacturing: Towards traceable porosity defect measurements using digital twins
Dimensional,3D printing,Metrology,X-ray
METAS-CT: Metrological X-ray computed tomography at sub-micrometre precision
Coordinate measuring machine (CMM),Dimensional,Metrology,X-ray
Long range wire based yaw measuring system for a 50 m bench
Metrology,Optical,Sensor,Straightness
Straightness and index sensor with sub-micron accuracy
Positioning,Straightness,Ultra-precision