Federal Institute of Metrology METAS

|Federal Institute of Metrology METAS

In-line microfocus X-ray focal spot condition monitoring for computed tomography


High-resolution X-ray computed tomography for additive manufacturing: Towards traceable porosity defect measurements using digital twins

Dimensional,3D printing,Metrology,X-ray

METAS-CT: Metrological X-ray computed tomography at sub-micrometre precision

Coordinate measuring machine (CMM),Dimensional,Metrology,X-ray

Long range wire based yaw measuring system for a 50 m bench


Straightness and index sensor with sub-micron accuracy


Virtual CMM method applied to a spherical lens parameters calibration

A 5 degrees of freedom µCMM

Metrology on micro-spheres with engineered surface texture

Calibration and correction of a 6 degree of freedom piezo driven stage

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