Project Description

2nd 3D Metrology Conference
9th-11th October 2017

Further Information

2nd 3DMC Conference : 9th-11th October 2017

Aachen, Germany

DMC is a conference and exhibition dedicated to the application and development of 3D measurement technology for industrial, scientific and cultural purposes. After the successful start of the series in Aachen in 2016, the organizing committee is dedicated to open the forthcoming second event to an even broader audience.
3DMC 2017 will again be hosted in Aachen.

3DMC aims at end users of 3D metrology systems, equipment and software suppliers, service providers, researchers and procurement and quality managers. These target audiences operate in sectors such as aerospace, automotive, power generation, marine, off-shore, built environment, cultural heritage and virtual reality. Users and developers from these diverse fields can share their differing experiences, values, and requirements while, at the same time, helping to drive the industry forward.

Typical conference themes include:

  • Technologies and applications of portable coordinate metrology from meso to large scale
  • Fixed 3D metrology on the micro to meso scale
  • 3D metrology for advanced manufacturing
  • Automation and in-process metrology
  • Future industrial requirements and next-generation technologies
  • Augmented reality
  • Measurement uncertainty and traceability
  • Additive manufacturing
  • Nondestructive testing

We welcome presentations of applications at all scales, from the reverse engineering and inspection of small parts to the as-built 3D modelling of entire process plants.

Whilst portable methods drive many developments in 3D metrology, we also want to hear about the high accuracies of fixed axis technologies and sub-surface inspection offered by computed tomography and non-destructive testing (NDT).

Conference format:
We request presentations only, no papers. The presentations will cover both applications-oriented and research-oriented subjects and will be publicly available in electronic format after the event.